IN-CIRCUIT HiTESTER
1220
Expansion Capabilities
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Hioki PCB and substrate inspection equipment leverages our core competency in high precision component testing. In populated board production settings where improving productivity is key, even small time losses are unacceptable. The 1220 series provide a single solution for jobs that previously required multiple measuring instruments, featuring a compact PCI bus that delivers a dramatic speed boost of 150%. Key Features |
Model No. (Order Code)
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HIOKI ATE LINEUP [ The Power to Connect ] The power to connect that Hioki’s printed circuit board testing systems deliver is the power to connect to the future. The ability to continue to support this rich and satisfying lifestyle together with customers is a small part of what testing systems can do. |
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FULL Lineup Available in desktop, space-saving, and inline models to accommodate the full range of site needs. |
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LED color recognition and brightness detection The 1220 incorporates a power source unit, allowing it to perform mounting tests and LED tests with a single fixture. |
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For people considering parts average testing (PAT) The 1220 brings the PAT process to testing of printed circuit boards and adds a rank detection function for ICT in order to improve quality. A rank detection flag is added to outliers (abnormal values) that are separated from the parent population. The decision of whether to perform rank detection can be added on a component-by-component basis. |
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Point information view (UA1782) Do you check data by looking at probe tips and asking yourself whether they’ll strike components on the board or not? Where are test fixture pins indicating fail results contacting the board?â It’s easy to identify the locations of defective pins and to search for components by using the Point Viewer while testing is underway or the while the Fail Viewer UA1782 is offline. |
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[Program,Test,Visualize] Populated Board Electrical Testing System Hioki can prepare populated board testing system benchmarks if provided with the three types of data listed below. A product catalog is available. |
Specifications overview
| 1220-50 | 1220-51 | 1220-52 | 1220-55 | |
| Test types and ranges | Round-robin short/open, Component test | |||
| Macro test : 10 ÎĐ to 10 MÎĐ (Impedance) | ||||
| Resistance : 400 ΞÎĐ to 40 MÎĐ | ||||
| Capacitance : 10 pF to 400 mF | ||||
| Coils : 1 ΞH to 100 H | ||||
| Diodes, transistors : 0 V to 25 V | ||||
| Zener diode : 0 V to 25 V (Option: 25 V to 120 V) | ||||
| Digital transistors : 0 V to 25 V | ||||
| Photo coupler test function : 0 V to 25 V | ||||
| Capacitor reverse insertion detection (Option), IC reverse insertion detection (Option) | ||||
| Number of Max. test points | Max. 2,176 pins (3 expansion racks), Standard: 128 pins |
Max. 2,176 pins (3 expansion racks), Standard: 320 pins |
Max. 1,536 pins (2 expansion racks), Standard: 320 pins |
Max. 2,176 pins (3 expansion racks), Standard: 320 pins |
| Can be expanded in blocks of 64. | ||||
| No. of Max. test steps | 10,000 steps | |||
| Measurement time | Round-robin short/open: From approx. 0.8 ms/pin Component: From approx. 0.9 ms/step |
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| Measurable board dimensions | — | 390 mm (15.35 in)W Ã 300 mm (11.81 in)D | ||
| Power supply | 100 V AC (Âą10%) (Specify at time of order), Power consumption: 700 to 1000 VA | |||
| Dimensions and mass | 200 mm (7.87 in) W Ã 325 mm (12.80 in) H Ã 298 mm (11.73 in) D, 10 kg (352.7 oz) | 1030 mm (40.55 in) W Ã 1470 mm (57.87 in) H Ã 710 mm (27.95 in) D, 240 kg (8465.6 oz) | 655 mm (25.79 in) W Ã 1610 mm (63.39 in) H Ã 705 mm (27.76 in) D, 220 kg (7760.1 oz) | — |
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| Catalog: FAIL VISUALIZER UA1782 | Download PDFÂ [1MB] | English |
| Catalog: POWER SOURCE UNIT 1937-04 | Download PDFÂ [1MB] | English |
| Catalog: IN-CIRCUIT HiTESTER 1220 | Download PDFÂ [5MB] | English |
| Catalog: Contact Probe series CP series, 1161 / 1171 / 1172 series | Download PDFÂ [1MB] | English |
| Catalog: Populated Board Electrical Testing System | Download PDFÂ [2MB] | English |
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